Volume 3 Number 2 (Feb. 2008)
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JCP 2008 Vol.3(2): 21-28 ISSN: 1796-203X
doi: 10.4304/jcp.3.2.21-28

Process Variation Aware Transistor Sizing for Load Balance of Multiple Paths in Dynamic CMOS for Timing Optimization

Kumar Yelamarthi, Chien-In Henry Chen
1Department of Electrical Engineering, Wright State University, Dayton, OH, USA

Abstract—The complexity in timing optimization of highperformance microprocessors has been increasing with the number of channel-connected transistors in various paths of dynamic CMOS circuits and the rising magnitude of process variations in nanometer CMOS process. In this paper, a process variation aware transistor sizing algorithm for dynamic CMOS circuits while considering the Load Balance of Multiple Paths (LBMP) is proposed. The proposed iterative optimization algorithm is a deterministic approach and is illustrated first by a 2-b weighted binary-tothermometric converter (WBTC) and of which the critical path was optimized from an initial delay of 355 ps to an optimal delay of 157 ps, which accounts for a 55.77% delay improvement. A 4-b unity weight binary-to-thermometric converter (UWBTC) was also designed and of which the critical path was optimized from an initial delay of 152 ps to an optimal delay of 103 ps, which accounts for a 32.23% delay improvement. Finally, a 64-b parallel binary adder was partitioned to a mixed dynamic-static CMOS style and the critical path and the power delay product were optimized to 632 ps and 84.17 pJ respectively.

Index Terms—dynamic CMOS logic, transistor sizing, timing optimization, process variations, binary-tothermometer decoder, parallel binary adders

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Cite: Kumar Yelamarthi, Chien-In Henry Chen, "Process Variation Aware Transistor Sizing for Load Balance of Multiple Paths in Dynamic CMOS for Timing Optimization," Journal of Computers vol. 3, no. 2, pp. 21-28, 2008.

General Information

ISSN: 1796-203X
Abbreviated Title: J.Comput.
Frequency: Bimonthly
Editor-in-Chief: Prof. Liansheng Tan
Executive Editor: Ms. Nina Lee
Abstracting/ Indexing: DBLP, EBSCO,  ProQuest, INSPEC, ULRICH's Periodicals Directory, WorldCat,etc
E-mail: jcp@iap.org
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