Volume 8 Number 5 (May 2013)
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JCP 2013 Vol.8(5): 1145-1156 ISSN: 1796-203X
doi: 10.4304/jcp.8.5.1145-1156

BAENPD: A Bilingual Plagiarism Detector

Mohammad Shamsul Arefin1, Yasuhiko Morimoto1, Mohammad Amir Sharif2
1 Graduate School of Engineering, Hiroshima University, Japan
2 The Center for Advanced Computer Studies, University of Louisiana at Lafayette, USA


Abstract—In this paper, for the first time, we present a bilingual plagiarism detection system, BAENPD that can detect plagiarism from electronic Bangla and English documents. It uses two different methods for detecting plagiarism. The first method is based on the analysis of individual contents of the documents, whereas second technique performs several statistical analysis of the documents. The system has been evaluated by real documents. We have found that our system can efficiently detect plagiarism between English and Bangla documents as well as from the documents of same language.

Index Terms—Plagiarism, statistical analysis, query execution, documents relevancy, root detection.

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Cite: Mohammad Shamsul Arefin, Yasuhiko Morimoto, Mohammad Amir Sharif, " BAENPD: A Bilingual Plagiarism Detector," Journal of Computers vol. 8, no. 5, pp. 1145-1156, 2013.

General Information

ISSN: 1796-203X
Abbreviated Title: J.Comput.
Frequency: Bimonthly
Editor-in-Chief: Prof. Liansheng Tan
Executive Editor: Ms. Nina Lee
Abstracting/ Indexing: DBLP, EBSCO,  ProQuest, INSPEC, ULRICH's Periodicals Directory, WorldCat,etc
E-mail: jcp@iap.org
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