Volume 13 Number 6 (Jun. 2018)
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JCP 2018 Vol.13(6): 638-654 ISSN: 1796-203X
doi: 10.17706/jcp.13.6.638-654

Detecting Design Level Anti-patterns; Structure and Semantics in UML Class Diagrams

Eman K. Elsayed, Enas E. El-Sharawy
Mathematics and Computer science Department, Faculty of science, Alazhar University, Cairo, Egypt.
Abstract—Nowadays generation of reliable patterns is a challenge in the software engineering field, so determination of the anti-patterns becomes an effective and objective concept to evaluate any design. This paper proposes a general method to detect anti-patterns; structure and semantics in case of UML(Unified modeling language) class diagram. The proposed method is classified as a hybrid between mathematical and meta-model approaches. Its four phases merge between OWL(Web Ontology Language) Ontologybased and event B for detection many anti-patterns; semantic and structure in UML class diagram components (attributes, classes, operations, and associations). The paper proves the proposed method in two ways; the first way is theoretical by coupling UML components with OWL and Event-B. The second way is experimental by applying the method on a sample of nine famous UML class diagrams used as templates. The method detects and corrects the anti-patterns which appeared 519 times.

Index Terms—Pattern, anti-pattern, Uml, event–B, ontology.

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Cite: Eman K. Elsayed, Enas E. El-Sharawy, "Detecting Design Level Anti-patterns; Structure and Semantics in UML Class Diagrams," Journal of Computers vol. 13, no. 6, pp. 638-654, 2018.

General Information

ISSN: 1796-203X
Frequency: Monthly (2006-2014); Bimonthly (Since 2015)
Editor-in-Chief: Prof. Liansheng Tan
Executive Editor: Ms. Nina Lee
Abstracting/ Indexing: DBLP, EBSCO, DOAJ, ProQuest, INSPEC, ULRICH's Periodicals Directory, WorldCat, CNKI,etc
E-mail: jcp@iap.org
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