Volume 12 Number 6 (Nov. 2017)
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JCP 2017 Vol.12(6): 486-499 ISSN: 1796-203X
doi: 10.17706/jcp.12.6.486-499

Fast Ray Simulation Method Applied in Microwave Radiation Brightness Temperature Imaging

Chuan Yin1, 2, Ju Qian1, Ming Zhang1, 2, Yaming Bo1, 2
1School of Electronic Science and Engineering ,Nanjing University of Posts and Telecommunications, Nanjing 210003, China.
2State Key Laboratory of Millimeter Waves, Southeast University, Nanjing 210096, China.


Abstract—Large-scale simulation and high quality of microwave brightness temperature imaging is the key technology for passive target detection. We applied the space meshing ray tracing method for brightness temperature tracing to establish a model of tracing and inversion. Simulated images were then compared with the measured images to verify the effectiveness of the proposed method. Results showed that the space meshing ray tracing method can significantly improve the calculation efficiency, thereby allowing high-accuracy large-scale simulation using the same calculation. The effect of the low-pass filter on the simulated image was also considered.

Index Terms—Radiation brightness temperature, simulation in microwave imaging, space meshing ray tracing, high accuracy.

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Cite: Chuan Yin, Ju Qian, Ming Zhang, Yaming Bo, "Fast Ray Simulation Method Applied in Microwave Radiation Brightness Temperature Imaging," Journal of Computers vol. 12, no. 6, pp. 486-499, 2017.

General Information

ISSN: 1796-203X
Abbreviated Title: J.Comput.
Frequency: Monthly
Editor-in-Chief: Prof. Liansheng Tan
Executive Editor: Ms. Nina Lee
Abstracting/ Indexing: DBLP, EBSCO,  ProQuest, INSPEC, ULRICH's Periodicals Directory, WorldCat, CNKI,etc
E-mail: jcp@iap.org
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