Volume 5 Number 3 (Mar. 2010)
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JCP 2010 Vol.5(3): 417-424 ISSN: 1796-203X
doi: 10.4304/jcp.5.3.417-424

Voltage Fluctuation and Flicker Monitoring System Using LabVIEW and Wavelet Transform

Zhenmei Li, Jin Shen, Peiyu Wei, and Tianze Li
School of Electric and Electronic Engineering,Shandong University of Technology, Zibo, China

Abstract—The paper puts forward a method which uses wavelet multi-resolution analysis to extract characteristics of voltage flicker, establishes the arithmetic model of voltage fluctuation and flicker, and it can detect the amplitude modulation waveform of the voltage flicker, and examine abrupt-change time, frequency, and amplitude of the amplitude modulation waveform. A voltage fluctuation and flicker monitoring system based on virtual instrument was developed, where the wavelet transform was applied to virtual instrument by using the MATLAB script node in LabVIEW. The evaluation indices of short-term flicker severity were obtained by using statistic sorting algorithms. Sensation level weighted filter, Square multiplier and first order low pass filter were designed.

Index Terms—flicker, voltage fluctuation, wavelet transform, frequency

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Cite: Zhenmei Li, Jin Shen, Peiyu Wei, and Tianze Li, " Voltage Fluctuation and Flicker Monitoring System Using LabVIEW and Wavelet Transform," Journal of Computers vol. 5, no. 3, pp. 417-424, 2010.

General Information

ISSN: 1796-203X
Abbreviated Title: J.Comput.
Frequency: Bimonthly
Editor-in-Chief: Prof. Liansheng Tan
Executive Editor: Ms. Nina Lee
Abstracting/ Indexing: DBLP, EBSCO,  ProQuest, INSPEC, ULRICH's Periodicals Directory, WorldCat,etc
E-mail: jcp@iap.org
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